Article Dans Une Revue IEEE Transactions on Applied Superconductivity Année : 2020

Study of Microwave Resonances Induced by Bias Lines of Shunted Josephson Junctions

Résumé

Bias lines routed over a ground plane naturally form microstrip lines associated with the presence of a capacitance. This can lead to unwanted resonances when coupled to Josephson junctions. This work presents an electrical model of a shunted Josephson junction with its bias lines and pads, fabricated with the 1 kA/cm² RSFQ niobium process of the FLUXONICS Foundry. A T-model is used to simulate the microwave behavior of the bias line, predict resonances and design resonance-free superconducting circuits. The I-V characteristics of three shunted Josephson junctions have been obtained from time-domain simulations done with JSIM and show a good match with the experimentally observed resonance at 230 GHz up to the normal resistance branch, measured at 4.2 K. The influence of the position and value of a series resistor placed on bias lines is studied to damp unwanted resonances at the junction.
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Dates et versions

hal-04873535 , version 1 (08-01-2025)

Identifiants

Citer

Ugur Yilmaz, Sasan Razmkhah, Romain Collot, Juergen Kunert, Ronny Stolz, et al.. Study of Microwave Resonances Induced by Bias Lines of Shunted Josephson Junctions. IEEE Transactions on Applied Superconductivity, 2020, 30 (7), pp.1301905. ⟨10.1109/tasc.2020.3004781⟩. ⟨hal-04873535⟩
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