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Journal Articles Microelectronics Reliability Year : 2020

Investigation of critical parameters in power supplies components failure due to electric pulse

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hal-03493510 , version 1 (21-11-2022)

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L. Curos, T. Dubois, G. Mejecaze, F. Puybaret, B. Plano, et al.. Investigation of critical parameters in power supplies components failure due to electric pulse. Microelectronics Reliability, 2020, 114, pp.113936 -. ⟨10.1016/j.microrel.2020.113936⟩. ⟨hal-03493510⟩
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